Hi @helixhero,
In terms of doing this in CS-tools, here is a relevant thread discussing this topic.
As @carlos mentioned, it might be easiest to select a single 2D-class and connect those particles to an inspect picks or curate exposures job for easy visualization. Curate exposures offers a nice way to see all of the stats in plots for micrographs that contain particles. By loading in a single class of particles and setting the micrograph selection criteria to mics that have a minimum of 1 particle (or some other number of particles), you can look for any correlations between number of particles and other micrograph metrics such as ice thickness, defocus, etc.
For example of an ion channel I am working on that has some preferred orientation (missing side views, so much so I have a single 2D-class of side views). By connecting the particles from this select 2D-job to a curate exposures job, it appears there isn’t a strong correlation to micrograph level parameters from CTF estimation or motion correction. Surprisingly, there seems to be a cluster of micrographs based on their index number that seem to indicate there is a specific area of the grid where these views end up being more prevalent. I hope this helps, let me know if you have any other questions.
All the best,
Kye