Overlapping particles during inspection

Currently when particles are close together relative to their size, there is no way to avoid duplicate picks. A relatively small fraction of the particle diameter needs to be specified during template picking, to get the nearby particles, but in inspection we can only apply global NCC or power thresholds. It would be good to have a “best NCC within distance” option, so that the best match from a group of overlapped particles can be used at this stage.