Hi Suhail - one more suggestion in the rework of this tool - could you please write out the thresholds that were used to the log file? This is useful for record keeping and writing methods later - e.g. “all micrographs with CTF fit worse than x Å or defocus greater than y µm were rejected” etc
Inspect picks. writes out the thresholds used, but exposure curation currently does not.
Cheers
Oli