Hi,
Would it be possible to add the micrograph index (and maybe other curate exposures parameters) to subset particles by statistic?
Consider the following scenario - I want to separate a dataset into different time groupings for refinement of beam tilt. Sometimes this can help substantially, if alignments have drifted or been changed during data collection.
Currently this is somewhat tedious:
…as it requires (unless I am missing something) a separate Curate Exposures and Exposure Group Utilities job for setting each exposure group, which I can then combine in a global CTF job. In this case it was worthwhile - resolution improved from 2.46 to 2.32 with time groupings, whereas it did not improve at all with image shift groupings.
It would be helpful to be able to do this either directly in the exposure group utilities job, or just to add micrograph index to Subset Particles by Statistic, so that one job could output all the different particle sets (which could then be assigned to different exposure groups).
Cheers
Oli