Mask micrographs by particle coordinates for second round of picking? [feature request]




when performing picking with templates, sometimes good particles are either missed completely, or picked off center and subsequently eliminated by 2D/3D classification. For performing a second round of picking, it would be useful if one could provide a set of known good coordinates (e.g. the final set of particles after junk removal and recentering), and then repick the micrographs with regions within a certain distance of these positions masked. This would hopefully then allow the user to find an additional set of particles, missed the first time, which could then be combined with the original set without fear of duplication.